Patents involving semiconducting and superconducting technologies
Assignee: IBM Corp. (Armonk, NY)
US Patents (2) filed (Pub App # 20120326720 and 20120319684)
Title: Modular array of fixed coupling quantum systems for quantum information processing
Inventors: Gambetta JM, Ketchen MB, Rigetti, CT, Steffen M
US Patent filed (Pub App # 20120319085)
Title: Array of quantum systems in a cavity for quantum computing
Inventors: Gambetta JM, Ketchen MB, Rigetti, CT, Steffen M
US Patent filed (Pub App # 20120286796)
Title: An active 2-dimensional array structure for parallel testing
Inventors: Bhushan M, Ketchen MB
US Patent filed (Pub App # 20120256651)
Title: Test structure for parallel test implemented with one metal layer
Inventors: Bhushan M, Ketchen MB
US Patent filed (Pub App # 20120256281)
Title: Semiconductor Devices having nanochannels confined by nano-meter spaced electrodes
Inventors: Harrer S, Ketchen MB, Ott JA, Polonsky S
US Patent # 8456169,
Title: High speed measurement of random variation/yield in integrated circuit device testing
Inventors: Bhushan M, Ketchen MB, Liang Q, Maciejewski EP
US Patent # 8310269
Title: Measurement of partially depleted silicon-on-insulator CMOS circuit leakage current under different steady state switching conditions
Inventors: Bhushan M, Ketchen MB
US Patent # 8248094
Title: Acquisition of silicon-on-insulator switching history effects statistics
Inventors: Bhushan M, Ketchen MB
US Patent # 8208288 (Additional patent with same title and complementary claims subsequently filed, Pub App # 20120108434)
Title: Hybrid superconducting-magnetic memory cell and array
Co-inventors: Bulzacchelli JF, Gallagher WJ, Ketchen MB
US Patent # 8188752
Yield improvement for Josephson junction test device formation
Inventors: Ketchen MB, Kumar S, Steffen M
US Patent # 8179120
Two additional patents with same title and complementary claims subsequently filed, Pub App # 20120166898 and 20120161807
Title: Single level of metal test structure for differential timing and variability measurements of integrated circuits
Inventors: Bhushan M, Ketchen MB, Kim C
US Patent # 8027797
Title: Methods and apparatus for determining a switching history time constant in an integrated circuit device
Inventors: Bhushan M, Ketchen MB, Pearson DJ
US patent # 7733109
Title: Test structure and method for resistive open detection using voltage contrast inspection
Co-inventors: Ketchen MB, McStay K, Patterson OD
US Patent # 7595654
Title: Methods and apparatus for inline variability measurement of integrated circuit components
Inventors: Bhushan M, Ketchen MB, Gettings KM, Haensch W, Ji BL, Ketchen MB
US Patent # 7583125
Title: Methods and apparatus for pulse generation used in characterizing electronic fuses
Inventors: Bhushan M, Ketchen MB, Kothandaraman C, Maciejewski EP
US Patent # 7512509
Title: M1 testable addressable array for device parameter characterization
Inventors: Bhushan M, Ketchen MB
US Patent # 7504896
Title: Methods and apparatus for inline measurement of switching delay history effects in PD-SOI technology
Inventors: Bhushan M, Ketchen MB
US Patent # 7504875
Title: Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuit
Inventors: Bhushan M, Ketchen MB, Kothandaraman C, Maciejewski EP
US Patent # 7355902
Title: Methods and apparatus for inline characterization of high speed operating margins of a storage element
Inventors: Bhushan M, Ketchen MB
US Patent # 7342406
Title: Methods and apparatus for inline variability measurement of integrated circuit components
Inventors: Bhushan M, Gettings KM, Haensch W, Ji BL, Ketchen MB
US Patent # 7295057
Title: Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuit
Inventors: Bhushan M, Ketchen MB, Kothandaraman C, Maciejewski EP
US Patent # 7265639
Title: Methods and apparatus for ring oscillator based MOSFET gate capacitance measurements
Inventors: Bhushan M, Ketchen MB
US Patent # 7190233
Title: Methods and apparatus for measuring change in performance of ring oscillator circuit
Inventors: Bhushan M, Ketchen MB
US Patent # 7176695
Title: Method and apparatus for measuring transfer characteristics of a semiconductor device
Inventors: Bhushan M, Ketchen MB
US Patent # 7145347
Title: Method and apparatus for measuring transfer characteristics of a semiconductor device
Inventors: Bhushan M, Ketchen MB
US Patent # 7085658
Title: Method and apparatus for rapid inline measurement of parameter spreads and defects in integrated circuit chips
Inventors: Bhushan M, Ketchen MB
US Patent # 7069525
Title: Method and apparatus for determining characteristics of MOS devices
Inventors: Bhushan M, Ketchen MB
US Patent # 6960926
Title: Method and apparatus for characterizing a circuit with multiple inputs
Inventors: Anderson CJ, Bhushan M, Ketchen MB
US Patent # 6798261
Title: Method and apparatus for characterizing switching history impact
Inventors: Bhushan M, Ketchen MB, Pearson D
US Patent # 6605981
Title: Apparatus for biasing ultra-low voltage logic circuits
Inventors: Bryant A, Cottrell P, Ellis-Monaghan J, Ketchen MB, Nowak E
US Patent # 6545333
Title: Light controlled silicon on insulator device
Inventors: Ketchen MB, Nowak E, Rankin J, Stevens K
US patent # 5786690
Title: High resolution three-axis scanning SQUID microscope having planar solenoids
Inventors: Kirtley JR, Ketchen MB
US patent # 5635836
Title: Mechanical apparatus with rod, pivot, and translation means for positioning a sample for use with a scanning SQUID microscope
Inventors: Kirtley JR, Blanton, SH, Ketchen MB
US patent # 5523686
Title: Probes for scanning SQUID magnetometers
Inventors: Kirtley JR, Ketchen MB
US Patent # 5056111
Title: Integrated Terahertz electromagnetic wave system
Inventors: Duling III IN, Griskowsky, DR, Halbout J, Ketchen MB
US patent # 5055158
Title: Planarization of Josephson integrated circuit
Inventors: Gallagher WJ, Hu C, Jaso MA, Ketchen MB, Kleinsasser A, Pearson D
US patent # 4851767
Title: Detachable high-speed opto-electronic sampling probe
Inventors: Ketchen MB, Moskowitz P, Scheuermann M
US Patent # 4588947
Title: Integrated Miniature DC SQUID susceptometer for measuring properties of very small samples
Inventor: Ketchen MB
US Patent # 4528530
Title: Low temperature electronic package having a superconductive interposer interconnecting strip type circuits
Inventor: Ketchen MB